Resolving Parameter Dependences for Interval Analysis of Linear Analog Circuits

In: SMACD 2006 - International Workshop on Symbolic Methods and Applications to Circuit Design. Università degli Studi di Firenze, October, 2006

Authors

• Alexander Dreyer

Abstract

Reliable methods for the analysis of tolerance-affected analog circuits are of great importance in nowadays microelectronics. Because of variations during the production, parameters of real circuits differ from the values specified in the design process. If upper and lower bounds of such parameter variations are known, interval analysis can be applied to analyze the effect of these deviations, but yet this was restricted to circuit equations without interdependences. Hence, for an efficient application of interval methods, it is crucial to regard possible dependences in circuit equations. Part and parcel of of this strategy is the handling of symbolic fill-in patterns of uncertain components. A variant of the Sherman-Morrison formula can be utilized for efficient frequency-response analysis of tolerance-affected linear analog circuits.

Full Text

• Publication: smacd06_dreyer.pdf

BibTeX

 
@InProceedings{ DreyerSMACD06, 
   title = { Resolving Parameter Dependences for Interval Analysis of Linear Analog Circuits }, 
   author = { Alexander Dreyer },   
   booktitle = { SMACD 2006 - International Workshop on Symbolic Methods and Applications to Circuit Design },       
   school = { Università degli Studi di Firenze },      
   month = oct, 
   year = 2006, 
} 

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This publication belongs to the project VerSiS.