Interval Analysis of Linear Analog Circuits

In: SCAN 06 - 12th GAMM - IMACS International Symposion on Scientific Computing, Computer Arithmetic and Validated Numerics. IEEE Computer Society Conference Publishing Services, Duisburg, Germany, ISBN-13: 978-0-7695-2821-2, September, 2006

Authors

• Alexander Dreyer

Abstract

Reliable methods for the analysis of tolerance affected analog circuits are of great importance in nowadays microelectronics. It is impossible to produce circuits with exactly those parameter specifications proposed in the design process. Such component tolerances will always lead to small variations of a circuit's properties, which may result in unexpected effects. If lower and upper bounds to parameter variations can be read off the manufacturing process, interval arithmetic naturally enter the circuit analysis area. The paper focusses on the analysis of linear analog circuits, typically consisting of current and voltage sources as well as resistors, capacitances, and inductivities. These are still widely used in analog circuit design as equivalent circuit diagrams for representing more complex systems in certain applications like frequency domain analysis.

Full Text

• Publication: DreyerSCAN06.pdf

BibTeX

 
@InProceedings{ DreyerSCAN06, 
   title = { Interval Analysis of Linear Analog Circuits }, 
   author = { Alexander Dreyer },   
   booktitle = { SCAN 06 - 12th GAMM - IMACS International Symposion on Scientific Computing, Computer Arithmetic and Validated Numerics },  
   series = { IEEE Computer Society Conference Publishing Services },      
   publisher = { Duisburg, Germany },    
   note = { ISBN-13: 978-0-7695-2821-2 }, 
   month = sep, 
   year = 2006, 
} 

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This publication belongs to the project VerSiS.